Probe diameter φ0.1 - Pitch contact probe
The previous process requires a tighter pitch and stable electrical performance compared to the subsequent process. We also accept orders for the production of probe cards!
At Seiken, we offer a lineup of vertical probes compatible with P=150um. The tip is made of a well-regarded alloy known for its contact with solder and is also compatible with crown cuts, allowing for stable contact with bumps. By using a specially shaped spring to maintain a constant load, the contact with bumps is better than that of probes using standard springs with the same pitch. 【Features】 ■ Lineup of vertical probes compatible with P=150um ■ Alloy compatible with crown cuts ■ Stable contact with bumps ■ Maintains a constant load using a specially shaped spring ■ Good contact with bumps *For more details, please refer to the PDF document or feel free to contact us.
- Company：精研 本社
- Price：Other
